Model 2790 SourceMeter
®
Switch System User’s Manual 5-31
Test procedure
The basic test procedure for using memory patterns to perform contact tests on a dual-state
inflator using scanning is shown in Table 5-7. The same test procedure using individual
memory pattern location recall is shown in Table 5-8.
This procedure sets up three memory locations for the necessary relay closures. Each
memory location is set up as follows:
• Delay: 0s
• Function: 2-wire ohms
• Range: 100
• Integration period: 1 PLC
After setting up memory locations (Table 5-7), the scan is enabled, triggered, and readings
are stored in the buffer for recall once the scan is complete. For the memory pattern loca-
tion recall shown in Table 5-8, memory locations are first set up, and each location is
recalled in succession.
Table 5-7
Command sequence for memory patterns test example using scanning
Command Sequence Description
*RST Restore GPIB defaults.
ROUT:MEM:CLE:ALL Clear all memory pattern locations.
Set up memory location 1:
ROUT:MEM:CHAN 1,(@101,114,118) Set channels 1, 14, and 18 for memory location 1.
ROUT:MEM:DEL 1,0 Set delay to 0.
ROUT:MEM:READ:STAT 1, ON Enable reading.
SENS:FUNC 'RES',(@M1) Select 2-wire ohms.
SENS:RES:RANG 100,(@M1) Select 100Ω range.
SENS:RES:NPLC 1,(@M1) Select 1 PLC.
Set up memory location 2:
ROUT:MEM:CHAN 2,(@104,114,118) Set channels 4, 14, and 18 for memory location 2.
ROUT:MEM:DEL 2,0 Set delay to 0.
ROUT:MEM:READ:STAT 2, ON Enable reading.
SENS:FUNC 'RES',(@M2) Select 2-wire ohms.
SENS:RES:RANG 100,(@M2) Select 100Ω range.
SENS:RES:NPLC 1,(@M2) Select 1 PLC.
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