Keysight B1500A Configuration and Connection Guide
1-29
B1500A Product Configuration
EasyEXPERT group+ software
result (tracing the I-V curve). Range of the sweep output and measurement can be
changed by the rotary knob on the front panel. Test setups can be saved, and used in the
classic test mode for further detailed measurement and analysis. Also see
“Oscilloscope view”.
• Quick test mode - A GUI-based quick test mode enables you to perform
test
sequenci
ng without programming. You can select, copy,
rearrange, and cut-and-paste
any test setup
s with a few simple mouse clicks. Once you have selected and arrang
ed
you
r tests, simply click on the measurement button to begin running an automated test
sequence.
Application library
Contains over 300 application test definitions conveniently organized by device
type, application, and technology. You can easily edit and customize the furnished
application tests to fit your specific needs.
The following table shows a part of tests included in the library. They are subject to
change without notice.
Table 1-27 Application library, Category list
Oscilloscope view
Available for the tracer test using MCSMU modules. The oscilloscope view displays
MCSMU current or voltage measurement data versus time. The pulsed measurement
waveforms appear in a separate window for easy verification of the measurement timings.
This function is useful for verifying waveform timings and debugging pulsed
measurements. It is available when a tracer test has one or more MCSMU channels being
used in pulsed mode. The oscilloscope view can display the pulse waveform at any (user
specified) sweep step of the sweep output.
• Sampling interval: 2 μs
• Sampling points: 2000 Sa
• Sampling duration: 22 μs to 24 ms
• Data saving
Numeric: TXT/CSV/XMLSS
Image: EMF/BMP/JPG/PNG
Category Test items
CMOS Id-Vg, Id-Vd, Vth, breakdown, capacitance, QSCV, etc.
BJT Ic-Vc, diode, Gummel plot, breakdown, hfe, capacitance, etc.
Discrete Id-Vg, Id-Vd, Ic-Vc, diode, etc.
Memory Vth, capacitance, endurance test, etc.
Power Device Pulsed Id-Vg, pulsed Id-Vd, breakdown, etc.
NanoTech Resistance, Id-Vg, Id-Vd, Ic-Vc, etc.
Reliability NBTI/PBTI, charge pumping, electromigration, hot carrier injection, J-Ramp, TDDB, etc.
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