METREL MI 3125 - Settings: RCD Test Standards

MI 3125 InstaltestCOMBO Settings
22
4.2.3 RCD standard
In this menu the used standard for RCD
tests can be set.
Figure 4.4: Selection of RCD test
standard
Keys:
UP / DOWN
Selects standard.
TEST
Confirms selected standard.
Function selectors
Exits back to main function menu.
Maximum RCD disconnection times differ in various standards.
The trip-out times defined in individual standards are listed below.
Trip-out times according to EN 61008 / EN 61009:
½×I
ΔN
*)
I
ΔN
2×I
ΔN
5×I
ΔN
General RCDs
(non-delayed)
t
Δ
> 300 ms t
Δ
< 300 ms t
Δ
< 150 ms t
Δ
< 40 ms
Selective RCDs
(time-delayed)
t
Δ
> 500 ms 130 ms < t
Δ
< 500 ms 60 ms < t
Δ
< 200 ms 50 ms < t
Δ
< 150 ms
Trip-out times according to EN 60364-4-41:
½×I
ΔN
*)
I
ΔN
2×I
ΔN
5×I
ΔN
General RCDs
(non-delayed)
t
Δ
> 999 ms t
Δ
< 999 ms t
Δ
< 150 ms t
Δ
< 40 ms
Selective RCDs
(time-delayed)
t
Δ
> 999 ms 130 ms < t
Δ
< 999 ms 60 ms < t
Δ
< 200 ms 50 ms < t
Δ
< 150 ms
Trip-out times according to BS 7671:
½×I
ΔN
*)
I
ΔN
2×I
ΔN
5×I
ΔN
General RCDs
(non-delayed)
t
Δ
> 1999 ms t
Δ
< 300 ms t
Δ
< 150 ms t
Δ
< 40 ms
Selective RCDs
(time-delayed)
t
Δ
> 1999 ms 130 ms < t
Δ
< 500 ms 60 ms < t
Δ
< 200 ms 50 ms < t
Δ
< 150 ms
Trip-out times according to AS/NZ
**)
:
½×I
ΔN
*)
I
ΔN
2×I
ΔN
5×I
ΔN
RCD type
I
ΔN
[mA] t
Δ
t
Δ
t
Δ
t
Δ
Note
I
≤ 10
40 ms 40 ms 40 ms
II
> 10 ≤ 30
300 ms 150 ms 40 ms
III > 30
> 999 ms
300 ms 150 ms 40 ms
500 ms 200 ms 150 ms
Maximum break time
IV
S
> 30 > 999 ms
130 ms 60 ms 50 ms Minimum non-actuating time
*)
Minimum test period for current of ½×I
ΔN
, RCD shall not trip-out.
**)
Test current and measurement accuracy correspond to AS/NZ requirements.