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SIF5600 - Manual - 03 - 2008
5.2 Reading WREG message
The purpose is to read the structure introduced in preceding paragraph.
WREG reading requires the ModBus function FUNC=03.
Remember that the structure NUM=5 must be pointed out with ADR=4 in the message, that is with NUM-1.
Request (values in hex format):
|-----------------------------|
|ADDR|FUNC| BODY |CRCH|CRCL|
|----|----|----|----|----|----|
|ADR |DIM |
|----|----|
21 03 0004 0007 42 A9
Response (values in hex format):
|---------------------------------------------------------|
|ADDR|FUNC| BODY |CRCH|CRCL|
|----|----|----|----|--------|----|--------|----|----|----|
|NBYT|INT | LONG |ENUM| B32 |B16 |
|----|----|--------|----|--------|----|
21 03 0E 0226 E6081DDA 0001 000A0000 0007 B9 26
SECTION 6 RREG DESCRIPTION
Nr.of the RREG structures: 31.
Every structure is listed.
RREG NUM=1 Description: Identification
Framing:
INT [ 1] Identification (1=SIF; 2=SVF ...)
LONG[ 2] Serial number
INT [ 4] FW release (format: XX.XX hex)
INT [ 5] Protocol release (format: XX.XX hex)
Dimension: 5 registers
Synopsis: class RREG -> ADR=0 (NUM=1), DIM=5
RREG NUM=2 RESERVED
RREG NUM=3 Description : Run-time info
Framing:
INT [ 1] Mean elab cycle (us)
INT [ 2] Max elab cycle (us)
INT [ 3] Stack load (%)
INT [ 4] Warm reset num.
INT [ 5] Sampling freq. (1=10 mHz)
Dimension: 5 registers
Synopsis: class RREG -> ADR=2 (NUM=3), DIM=5
RREG NUM=4 Description : Self-test diagnostics
Framing:
ENUM[ 1] Self-test
0 None
1 Minor
2 Major
3 Fatal
B16 [ 2] Self-test cause
bit 0 Stack overflow
bit 1 reserved
bit 2 Eeprom overflow
bit 3 Eeprom CAL fail
bit 4 Eeprom PAR fail
bit 5 Eeprom REE fail
bit 6 reserved
bit 7 reserved
bit 8 HW fail
bit 9 Coil fail
bit 10 PW break Blin1
bit 11 reserved
bit 12 PW shorted
bit 13 CB fail
B16 [ 3] Self-test latch