Elrepho 3000
Technical Data* - Elrepho 3000
Measurement
Geometry d/0 degree, dual beam, barium sulfate coated sphere
Measurement Principle Proprietary MC90 dual beam spectrometer with dual
128 pixel custom diode arrays
Aperture Sizes XLAV - 29mm measured; 33mm illuminated
SAV - 5mm measured, 9mm illuminated
USAV - 2.5mm measured; 6.5mm illuminated
Spectral Factor Excluded
Spectral Range 380 nm to 720 nm measured
400 nm to 700 nm reported every 10nm
Bandwidth 10 nm
% Reflectance 0 to 200%
Light Source Pulsed xenon, filtered to D65
Measurement Time 1 sec
Performance
Repeatability 0.01 CMC on white
62 Datacolor International
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