MATRIX 400™ CODE QUALITY VERIFIER SOLUTION
2
Defects are irregularities found within elements and quiet zones, and are measured in terms
of element reflectance non-uniformity.
Element reflectance non-uniformity within an individual element or quiet zone is the
difference between the reflectance of the highest peak and the reflectance of the lowest
valley.
Defect measurement is expressed as the ratio of the maximum element Reflectance Non-
Uniformity (ERNmax) to Symbol Contrast.
Defects = ERNmax / SC
Minimum Edge Contrast (EC)
Edge contrast is the difference between the Rs (Space Reflectance) and Rb (Bar
Reflectance) of adjoining elements including quiet zones.
The lowest value of edge contrast found in the scan reflectance profile is the minimum edge
contrast, ECmin.
EC = Rs - Rb
Minimum Reflectance (Rmin)
Rmin is the lowest reflectance value in the scan reflectance profile. Rmin shall not be higher
than 0,5 x Rmax. This parameter is intended to ensure that Rmin shall not be too high,
especially when the value of Rmax is high.
Modulation (MOD)
Modulation is the ratio of the minimum edge contrast to Symbol Contrast. It can be
considered as the quality of the Analog signal related to the printing contrast.
MOD = ECmin / SC
Symbol Contrast (SC)
Symbol contrast is the difference between the highest and lowest reflectance values in a
scan reflectance profile.
SC = Rmax - Rmin
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