Operating Instructions
Operation
2
2-23
2000mA
2000nS
A
A
COMMON
V Ω S
V
Ω
S
200mA
200
200k
200µA
DC
AC
Hz
200mV
200Ω
20mA
20
20k
2mA
2
2k
1000 DC
750 AC
MΩ
Hz
dB
REL
1000V DC
750V AC
MAX
2A MAX
500V MAX
!
!
Diode Test ( )
Low (-)
Forward Bias:
Reverse Bias:
High (+)
BlackRed
Black Red
1. Press both switches
simultaneously
2. Set switch to select
diode test
3. Ensure all other switches
are out (except the AC/DC
switch which can be in or out).
4. Connect the test leads as shown.
5. Heed the input overload limits
(Table 2-2) and connect the test
leads to diode being measured.
6. Read the measured value on the display.
Typical reading +
forward-biased
silicon diode.
Overrange display
if parallel resistance
is >2 KΩ.
dx17f.eps
Figure 2-16. Diode Test
2-21. Diode Test ( )
Selection of the diode test is described in Figure 2-16. Notice how the test
leads are placed to forward-bias or reverse-bias the diode in the figure.
The diode test measures the forward voltage of a semiconductor junction (or
junctions) at a 1 mA test current. Readings are displayed in the 2V range,
with OL displayed for voltages greater than 2V. For a silicon diode, the
typical forward voltage at 1 mA is about 0.6V. A reverse-biased
semiconductor junction should display the overrange (OL) indicator
provided that any resistance parallel to the junction is greater than 2 kΩ.
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