GE Sievers 500 RL - Figure 24 Reviewing TC and IC Values from a Single-Point Calibration; Figure 25 Reviewing Conductivity Values from a Single-Point Calibration

GE Analytical Instruments ©2010 119 of 226 DLM 74001-04 Rev. A
Chapter 6: Calibration and System Protocols
17. You should now verify the calibration. Proceed to “Accuracy, Precision, and Calibration Verification” on
page 124 for instructions.
Figure 24: Reviewing TC and IC Values from a Single-Point Calibration
Figure 25: Reviewing Conductivity Values from a Single-Point Calibration