GE Sievers 500 RL - JP Protocol Worksheet

GE Analytical Instruments ©2010 138 of 226 DLM 74001-04 Rev. A
Chapter 6: Calibration and System Protocols
JP Protocol Worksheet
Company Name ____________________________ Date _________________________
Analyst Name ______________________________ Firmware Version ______________
Analyzer Serial Number ______________________ Standards Expiration Date _____________
Standards Set Lot No. ___________________________________
TOC Blank Average_____________________________________ (Line 1)
500 ppbC SDBS Average_________________________________ (Line 2)
SDBS Blank-Corrected Average ___________________________ (Line 3)
SDBS Average (Line 2) – TOC Blank Average (Line 1) = SDBS Blank-Corrected Average (Line 3)
Average Temperature-Corrected Conductivity of 29.4 μS/cm __________________ (Line 4)
Temperature __________________________________________________________ (Line 4)
RSD__________________________________________________________________ (Line 5)
Difference ____________________________________________________________ (Line 6)
Acceptance Criteria for JP Protocol TOC (Only):
TOC Blank Average  250 ppb
Blank-Corrected Average  450 ppb
 Pass  Fail
OR
Acceptance Criteria for JP Protocol TOC and Conductivity:
TOC Blank Average
 250 ppb
Blank-Corrected Average
 450 ppb
Conductivity Difference
±
RSD  2%
Sample temperature is between15°C to 30°C
 Pass  Fail