Hioki 3522-50 - Setting the Compensation Method

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4.7 Open Circuit Compensation
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4.7.2 Setting the Compensation Method
A
LL ke
y
Press this key to interrupt setting
and return to the Initial screen.
OFF ke
y
SPOT ke
y
1. Arrange the test leads as closely as possible to their configuration in which
measurement will be performed, and make sure that the HIGH and LOW
leads are not contacted together.
2. When the open circuit compensation is performed, execute the guarding
process. (For the guarding process, refer to Section 5.2.)
3. On the Initial screen, press the key, and the Menu screen will be
displayed.
4. Press the key on the Menu screen, and the Open circuit compensation
screen will be displayed.
5. The OPEN circuit compensation method can be set to:
:
The compensation values are obtained for all test frequencies.
:
The compensation values are obtained at the set test frequency only.
:
The open circuit compensation data are cleared.