E8257D/67D, E8663D PSG Signal Generators Service Guide
Post–Repair Procedures
Post–Repair Procedures Matrix
4-12
Sub–Harmonic Spurious
✓✓✓
Non–Harmonic Spurious
✓ ✓ ✓ ✓ ✓ ✓
External FM Deviation Accuracy
(E8257D/E8267D/E8663D Option UNT )
✓✓✓
External Phase Modulation Frequency Response
(E8257D/E8267D/E8663D Option UNT without UNY)
✓ ✓ ✓
External Pulse Modulation On/Off Ratio
(E8257D/E8267D Option UNU with serial prefix <
4928, UNW, UNS, or HNS, E8663D Option UNW )
✓✓ ✓✓
Single- Sideband Phase Noise (Option UNX or UNY
test procedure)
✓ ✓ ✓ ✓ ✓ ✓ ✓
Single- Sideband Phase Noise (Non-Option UNX or
UNY test procedure)
✓✓✓✓✓✓
✓
Residual Phase Noise (E8257D/E8267D/E8663D
Option UNX or UNY and without H5Y Only) (Manual
Performance Test)
✓ ✓ ✓ ✓ ✓ ✓ ✓
Internal EVM Digital Modulation Quality (E8267D
Option 601 or 602 Only)
✓
✓✓
Digital Modulation Power Relative to CW (E8267D
Only)
✓ ✓ ✓
Swept Frequency Accuracy (E8257D/E8267D/E8663D
Option 007 )
✓
✓
Table 4-11 Performance Tests: Assemblies A18—A29 (For prefixes >= xx4928)
Performance Tests Replaced Assembly
The following performance tests are listed in the order
that they should be performed to minimize changes in
test equipment configurations.
A18 CPU or BT1
A19 Power Supply
A20 SMI [Source Module Interface]
A21 Rear Panel Interface
A22 Line Module
A23 Lowband Coupler/Detector
A24 20 GHz Coupler
A24 40 GHz Coupler
A24 67 GHz Coupler
A25 20 GHz Detector
A25 40 GHz Detector
A25 67 GHz Detector
A25B Detector Bias Board
A26 MID [Microcircuit Interface Deck]
A27 40 GHz Doubler
A28 YIG Oscillator
A29 20 GHz Doubler
Self Check Test
✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓
Maximum Leveled Output Power
✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓
Power Level Accuracy
✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓
Internal FM Frequency Response (E8257D/E8267D/E8663D
Option UNT Only)
✓
Internal Phase Modulation Deviation Accuracy
(E8257D/E8267D/E8663D Option UNT )
✓
Harmonic Spurious
✓ ✓ ✓ ✓
Table 4-10 Performance Tests: Assemblies A1—A17 (For prefixes >= xx4928) (Continued)
Performance Tests
The
following performance tests are listed in the order
that they should be performed to minimize changes
in test equipment configurations.
Replaced Assembly
A1 Keyboard
A2 Display
A2DS1 Backlight
A3 Power Switch
A4 Inverter
A5 Sampler
A6 Frac–N
A7 Reference (Standard)
A7 Reference (Option UNR/UNX)
A8 Output (Analog)
A8 Output (Digital)
A9 YIG Driver
A10 ALC
A11 Pulse/Analog Mod Gen
A12 Lowband Fast Pulse
A13 IQ Multiplexer
A14 Baseband Generator
A17 Baseband Generator Interface
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