E8257D/67D, E8663D PSG Signal Generators Service Guide
Post–Repair Procedures
Post–Repair Procedures Matrix
4-13
Sub- Harmonic Spurious
✓ ✓ ✓
Non- Harmonic Spurious
✓
External FM Deviation Accuracy (E8257D/E8267D/E8663D
Option UNT )
✓
External Phase Modulation Frequency Response
(E8257D/E8267D/E8663D Option UNT without UNY)
✓
Single- Sideband Phase Noise (Option UNX or UNY test
procedure)
✓
Single- Sideband Phase Noise (Non- Option UNX or UNY
test procedure)
✓
Residual Phase Noise (E8257D/E8267D/E8663D Option
UNX or UNY and without H5Y Only) (Manual Performance
Test)
✓
Table 4-12 Performance Tests: Assemblies A30—A46, AT1, B1, and RF Output Connector (For prefixes >= xx4928)
Performance Tests Replaced Assembly
The following performance tests are listed in the order that
they should be performed to minimize changes in test
equipment configurations.
A30 Mod Filter with High Power
A30 Mod Filter with Standard Power
A31 Motherboard
A32 10 MHz Crystal Oscillator
A34 Internal Hard Drive
A35 3 − 20 IQ Modulator
A36 Quadraplier
A37 Up Converter
A38 Lowband Switch Filter
A39 Directional Coupler
A40 Compact Flash Drive
A43 LB Amp/Filter
A44 Scan Mod
A45 Frac- N/Offset
A46 Offset Loop
AT1 115 dB Attenuator
B1 Fan
RF Output Connector
Self Check Test
✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓
Maximum Leveled Output Power
✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓
Maximum Leveled Output Power - Digital Mode (E8267D Option
HBL Only)
✓ ✓
Maximum Leveled Output Power - Wide IQ/FM Mode (E8267D
Option H18 Only)
✓ ✓
Power Level Accuracy
✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓
Internal Pulse Modulation Level Accuracy (E8257D/E8267D
Option UNU, UNW, UNS, or HNS, and E8663D Only)
✓ ✓ ✓ ✓
Internal Pulse Modulation Rise/Fall Time (E8257D/E8267D Option
UNW, UNS, or HNS, E8663D Option UNW )
✓ ✓ ✓ ✓
DC FM Carrier Offset (E8257D/E8267D/E8663D Option UNT )
✓ ✓
Harmonic Spurious
✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓ ✓
Sub–Harmonic Spurious
✓ ✓ ✓ ✓ ✓ ✓
Table 4-11 Performance Tests: Assemblies A18—A29 (For prefixes >= xx4928) (Continued)
Performance Tests Replaced Assembly
The following performance tests are listed in the order
that they should be performed to minimize changes in
test equipment configurations.
A18 CPU or BT1
A19 Power Supply
A20 SMI [Source Module Interface]
A21 Rear Panel Interface
A22 Line Module
A23 Lowband Coupler/Detector
A24 20 GHz Coupler
A24 40 GHz Coupler
A24 67 GHz Coupler
A25 20 GHz Detector
A25 40 GHz Detector
A25 67 GHz Detector
A25B Detector Bias Board
A26 MID [Microcircuit Interface Deck]
A27 40 GHz Doubler
A28 YIG Oscillator
A29 20 GHz Doubler
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