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Tonghui TH2883-5 - Test Imp; Erase Imp; Volt ADJ; Wave Disp

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TH2883 Series Operation Manual Chapter 5 Introduction to [SETUP]
5-3
5.2.3 Test Imp
The number of tested impulses can be set from 1 to 32. Move the cursor to this zone, the
following soft keys will be displayed.
They are fine adjustment soft keys used to change the number of impulses by 1.
Lighten this key to enable the numerical arrow key. Respectively press 8, 2, 4, 6, the
cursor will move up, down, left and right.
Note: User can directly input the desired number by numerical keys. In the state of
inputting numbers, soft keys are unavailable. ENTER can be used to terminate
inputting.
5.2.4 Erase Imp
The number of erase impulses can be set from 0 to 16. Move the cursor to this zone, following
soft keys will be displayed.
They are fine adjustment soft keys used to change the number of impulses by 1.
Lighten this key to enable the numerical arrow key. Respectively press 8, 2, 4, 6, the
cursor will move up, down, left and right.
Note: User can directly input the desired number by numerical keys. In the state of
inputting numbers, soft keys are unavailable. ENTER can be used to terminate inputting.
5.2.5 Volt ADJ
For different load on each DUT, when a given impulse voltage is applied across them, the actual
voltage applied on each DUT may also be different. User can turn on the voltage adjust function
to automatically change the output voltage, thus making all voltages applied across all DUT
identical.
Move the cursor to this zone, following soft keys will be available.
ON Turn on the voltage adjust function.
OFF Turn off the voltage adjust function.
Lighten this key to enable the numerical arrow key. Respectively press 8, 2, 4, 6, the
cursor will move up, down, left and right.
5.2.6 Wave Disp
If user only wants the comparison result, the wave display can be switched off so as to obtain a
test speed much faster.
Move the cursor to this zone, following soft keys will be displayed.
ALL ON Both the standard waveform and the test waveform will be displayed on the
screen at the same time. For the consumption of display time, the test speed
will be decreased. This display will bring convenience for user to observe

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