Agilent Technologies 89410A - To create a waveform using multiple, measured traces

1-42
Troubleshooting the Analyzer
To perform self tests
Failing Self Test or Message Displayed Status Probable Faulty
Assembly
Next Test
Calibration
Calibration information:
Channel number fails pad test
FAIL A10 Analog Input, channel
number
Calibration
Calibration information:
Calibrator way out of range
FAIL To adjust calibrator, page 2-37
Calibration
Calibration information:
Any of the following:
Source fails level test
Calibrator level message
Calibrator gain reset to 1.0
Auto-zero: can’t compensate CH1 DC offset.
Can’t compensate CH1 DC offset.
FAIL or
ABORT
A35 Analog Source
A10 Analog Input
A21 A/D Converter
A30 Digital Source
Source and calibrator out,
page 1-62
Calibration
Calibration information:
Any of the following:
Auto-zero: can’t compensate CH2 DC offset.
Can’t compensate CH2 DC offset.
FAIL or
ABORT
A10 Analog Input, channel 2
A21 A/D Converter,
channel 2
Two channel analyzer,page 1-75
Calibration
Calibration information:
Any of the following:
Failure in partial trigger counter
Partial trigger cal: can’t trigger!
Bad value from partial sample counter
Exceeded trigger jitter limits
Cal HW Timeout in readTrigPoints()
Cal HW Timeout in getTimeAvgData()
Failed to trigger
FAIL or
ABORT
A36 Trigger
A10 Analog Input
A55/A56 Sample RAM
A50 Digital Filter
A30 Digital Source
Trig ge r, page 1-83
Calibration
Calibration information:
Hardware timeout occurred during
calibration while waiting for sample RAM to
acquire data.
ABORT A36 Trigger
A10 Analog Input
Check cables to A36 Trigger
Trig ge r, page 1-83
Calibration
Calibration information:
Use the information to help isolate the
failure
FAIL or
ABORT
Performance test, page 1-58
All self tests and calibration PASS Step 4