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Troubleshooting the Analyzer
To troubleshoot self-test lockup failures
2 Repeat the sample RAM self test without the Digital Source assembly.
a Set the power switch to off ( O ).
b Pull the A30 Digital Source assembly out of the card nest about 1
inch.
c Set the power switch to on ( l ).
d When the power-up tests are finished, press the following keys:
[System Utility]
[
auto cal off]
[more cal setup
]
[
auto zero cal off]
[Return
]
[
more]
[
diagnostics]
[
service functions]
1125
[
enter]
[
test log]
[
Return]
[
functional tests]
[
sample RAM]
e If the sample RAM self test fails or aborts, the A55/A56 Sample
RAM assembly is probably faulty.
f If the sample RAM self test passes, the A30 Digital Source
assembly is probably faulty.
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