Analyzing Samples
Agilent Cary 630 FTIR Spectrometer User’s Guide 35
In the sample loading and cleaning mode, the sample press should be
in the highest position, so the sample press tip is well above the Ge
sampling window (see Figure 7). It is in this position that the sample
mounting area can be easily accessed for loading the sample into place
and for cleaning the sampling surfaces before the next sample is
analyzed.
Figure 7. Ge ATR accessory sample press
In the sample analysis mode, the sample press is lowered such that
the tip is in contact with a solid sample. In this position, contact is
made between the sample and the infrared energy emitting from the
Ge window.
NOTE
If the sample is a liquid or paste, the sample press does not need to be used at
all.
CAUTION
When using the swivel press mechanism, please ensure that the press and tip
are in the upmost position before turning the press out of or into position
When in the sample analysis mode, the ATR sample pathlength is
fixed, based on the number of reflections in the ATR. The alignment of
the accessory is also pre-set at the factory, so there is no optical or
mechanical adjustment required.
Ge sampling window
Sample press tip
Sample press knob
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