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Agilent Technologies E4402B - MEASURE Function - TOI, Spurious Emissions, Spectrum Emission Mask

Agilent Technologies E4402B
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158 Chapter 2
Front-Panel Key Reference
MEASURE
NOTE The analyzer defaults to zero-span mode and the sweep time is set to
capture at least one burst. The sweep time can be changed by pressing
Sweep, Sweep Time.
Pressing
Meas Setup after Burst Power has been selected will access the
burst power measurement setup menu. Pressing
Meas Control after
Burst Power has been selected will access the burst power control menu
which allows you to pause or restart your measurement, or toggle
between continuous and single measurement.
Key Access:
MEASURE, More
NOTE The measurements described above are those available in SA mode (see
Mode key). Other measurements are available in other modes if an
optional personality is installed.
Intermod (TOI) Computes and displays the third order intercept (TOI) point and places
markers on the trace to indicate the measured signals and third-order
products.
Key Access:
MEASURE, More
Spurious
Emissions
The spurious emissions measurement identifies and determines the
power level of spurious emissions in certain frequency bands.
Key Access:
MEASURE, More
Spectrum
Emission Mask
The spectrum emission mask measurement includes the in-band and
out-of-band spurious emissions. It may also be expressed as a ratio of
power spectral densities between the carrier and the specified offset
frequency band.
Key Access:
MEASURE, More

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