EasyManua.ls Logo

Ametek EM TEST compact NX - General; Test Methods for Surge and Ring Wave to High Speed Datalines

Ametek EM TEST compact NX
50 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Loading...
AMETEK CTS Quick start guide - Conducted
1.00 46 / 50
1 Insulating plate
2 Indication Protected side
3 Output Port AE
4 Earth plugs
5 Indication Unprotected side
6 Output Port EUT via coupling/decoupling network
11.7. General
Coupling of the surge pulses is achieved by means of the coupling / decoupling network HSC 4-8. For additional protection of the
auxiliary equipment by reducing the residual voltage level the SPN 508N1 is used.
The HSC 4-8 design is based on the IEC 61000-4-5 (Ed 3.0: 2012) figure 11, IEC 61000-4-12 (Ed. 3) figure 10.
The HSC 4-8 allows the following couplings with separate input connectors:
- Surge and Ring wave pulses to data-lines
- Surge pulses to shield
- Burst pulses to shield
For an additional overvoltage protection of the AE port the SPN 508N2 can be used for limiting the residual voltage to approx. 10V.
Figure 63 - Schematic of the HSC 4-8 for Surge to high speed
data-lines
Figure 64 - Schematic of the HSC 4-8 for Ring Wave to high
speed data-lines
11.8. Test methods for Surge and Ring Wave to high speed datalines
The IEC 61000-4-5 Ed.3 Surge standard shows in figure 11 the coupling network for testing high speed datalines.
The solution for coupling/decoupling is based on the existing methods of surge testing. There are two different Methods for testing
surge pulses on datalines.
Coupling to shielded lines

Table of Contents

Related product manuals