3.4.3 Secondary Processing…………………………………………...………………..3-29
3.4.4 Wavelength Scan Sampling Interval List…..…………………...………………..3-33
3.5 TIME SCAN………………………………………...…………………………………..3-34
3.5.1 Measurement Conditioning Setting……………………………..….…………….3-34
3.5.2 Performing a Time Scan Measurement…………………….…………….………3-38
3.5.3 Secondary Processing……………………………………….……………………3-39
3.6 MULTIPLE WL…………………………………………………………………………3-46
3.6.1 Measurement Conditions Setting……………………………………..…………..3-46
3.6.2 Performing Multiple WL Measurement…………………………………….……3-53
3.7 FILE MANAGER………………………………………………………………...………3-55
3.7.1 Inside Memory…………………………………………………………..………..3-55
3.7.2 Flash Memory…………………………………………...………………………..3-56
3.8 C
ALIBRATING THE WAVELENGTH…………………………………………………...…3-58
3.8.1 Calibrating the Wavelength………………………………………………………3-58
3.8.2 Set Time……………………………………………………………………..……3-59
3.8.3 Recording Lamp Usage…………………………………………………….…….3-60
3.8.4 GLP/GMP…………………………………………………………………...……3-60
3.9 T
EST MENU…………………………………………………………………………..3-65
3.9.1 Retrieving a Test Stored in Inside Memory………………………….…..3-65
3.9.2 Deleting Test From Inside Memory………………………………………3-65
3.9.3 Autostart Function………………………………………………………………3-66
CHAPTER 4 MAINTENANCE…………………..………….…………….4-1
4.1 SELF DIAGNOSIS AND AUTOMATIC ADJUSTMENT………………….….………………..4-1
4.2 C
ONFIRMATION OF SPECIFICATIONS…………………………….….….……..…………4-1
4.2.1 Wavelength Accuracy…………………………………………..….….…………4-1
4.2.2 Spectrum Bandwidth………………………………………….…...……………4-2
4.2.3 Check for Baseline Flatness……………………………………..……………….4-2
4.2.4 Confirmation of Baseline Flatness……………………………..…………………4-3
4.3 PERIODIC INSPECTION………………………………………………..…….………….4-4
4.3.1 Cleaning Sample Compartment……………………………….….………………4-4
4.3.2 Cleaning the Sample Compartment…………………………….….……………..4-6
4.4 TROUBLESHOOTING………………………………………………….….……………..4-7
CHAPTER 5 REPLACEMENT OF PARTS…………………….……….5-1
5.1 CONSUMABLES AND SPARE PARTS ……………………………………………………..5-1
III
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