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Hitachi F-4700 - Optical System

Hitachi F-4700
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2 - 10
2.3.2 Optical System
The optical system of the F-4700 is shown in Fig. 2-10. The light emitted from the Xe lamp is condensed
on entrance slit S1 of the excitation side monochromator via lenses L1 and L2. The light (excitation light)
separated by EX side diffraction grating enters exit slit S2. The light coming from S2 is reflected by
concave mirror M1, divided into two by beam splitter BS, part of which irradiates the monitor detector, and
this light quantity is measured. A large part of the excitation light divided by the beam splitter BS is
condensed on the sample cell via lens L3.
Fluorescence emitted from the sample is reduced and directed into entrance slit S3 of the emission side
monochromator via lenses L4 and L5. The fluorescence separated by EM side diffraction grating goes
out through exit slit S4, and is condensed onto the photomultiplier by concave mirror M2, whereby its
intensity is measured.
Provided before the excitation side slit is a mechanism for cutting off (shutter action) or chopping (chopper
action) the excitation light; in the phosphorescence measuring mode, for instance, the chopper rotates and
the excitation light is formed into a pulse shape.
Fig. 2-10 Optical System of the F-4700
Chopper (used
also as shutter)
Excitation
side slit
EX side diffraction
grating
Monitor
Emission
side slit
EM side diffraction
grating
Photomultiplier
Sample cell
Xe lamp

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