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General| Measurement Range | Na to U |
|---|---|
| Detection Limit | ppm level |
| Sample Types | Solids, liquids, powders |
| Power Supply | AC 100-240V, 50/60Hz |
| Elements Measured | From Sodium (Na) to Uranium (U) |
| Sample Form | liquids |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | Rh target |
| Type | X-ray Fluorescence (XRF) Spectrometer |
Symbols indicating X-ray generation, toxic material, electricity, and general warnings.
Details on shielded enclosure, dosage levels, owner's responsibilities, and warning lights.
Warnings about beryllium windows, toxicity, and handling precautions.
Procedures for liquid spills from sample cells and outer surfaces.
Opening case, inspecting for damage, and placing the instrument.
Lists accessories kit with part numbers and descriptions.
Lists and identifies various connectors on the instrument.
Importance, assembly, and handling of secondary safety windows.
Steps to turn on the instrument, enabling X-rays, and software loading.
Levels of user access, PIN entry, and the ready screen.
Overview of touch-screen control, gestures, and main screen layout.
Steps for checking method, naming samples, and preparing for analysis.
Display of measurement results, sample name, chemistry, units, and pass/fail.
Method to access the main navigation screen by dragging the status bar.
Shortcuts to frequently used options on the left side of the pulldown menu.
Steps to connect to Wi-Fi networks, turn on/off, and manage connections.
Process of naming samples for easier result identification and retrieval.
Accessing the main navigation panel for software settings and choices.
Options for selecting parameters, calibrations, analytes, and settings for analysis.
Creating a new calibration by defining conditions, standards, and analysis.
Performing regression of raw intensity data against standard concentrations.
Performing a full spectrum scan for sample investigation and configuration.
Storing and viewing analyzed sample results, and exporting data.
Configuring, updating, and connecting the instrument via the settings menu.
Forcing regression through zero concentration by subtracting blank intensity.
Correcting for interference where one element's signal overlaps another's.
Correcting for intensity modification due to presence of another element.
Measuring samples (SUSs) before applying corrections like blank or overlap.
Specifications for device type, voltage, current, power, dimensions, and weight.
Specifications for target material, voltage, current, and power of the X-ray tube.
Table detailing feature access rights for Operator, Advanced Operator, and Manager user levels.
Guidelines for preparing solids, powders, liquids, organic solids, and paper samples.
Methods to test for instrument precision, sample presentation, and preparation errors.
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