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Hitachi LAB-X5000 - Setting Up Samples (SUSs) for Instrument Corrections

Hitachi LAB-X5000
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In a sample containing S and Cl, the Cl radiation will be emitted t 2.622keV. The 6.4.2.2.
absorption edge for S is 2.47keV. The S in the sample will be excited by the Cl radiation
and the intensity of Cl radiation emanating from the sample will be reduced by the
presence of S.
A mass absorption correction of S on Cl will correct for the effect. 6.4.2.3.
Select Method from the pull-down menu, then tap Regressions. Choose 6.4.3.
Absorption/Enhancement Corrections.
6.5.
Setting Up Samples (SUSs)for Instrument Corrections
When an X-ray correction is to be applied, such as blank or overlap correction, then a 6.5.1.
sample or Setting Up Sample (SUS) must be measured before a Regression is
performed.
If a Blank Subtraction has been specified, then a blank sample or SUS needs to be 6.5.2.
measured as an instrument correction.
Hitachi High-Tech Analytical Science
47

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