5Service
142 Keysight 34420A Service Guide
607 Rundown too noisy This test checks the gain repeatability between the integrating ADC
and the U500 on-chip ADC. The gain test (606) is performed eight times. Gain noise must
be less than ±64 lsb's of the U500 on-chip ADC.
608 Serial configuration readback failed This test re-sends the last 9 byte serial configuration
data to all the serial path (SERDAT, SERBCK, SERCLK). The data is then clocked back into
U501 and compared against the original 9 bytes sent. A failure occurs if the data do not
match. This tests checks the serial data path through U501, U101, U150, and U601 through
U606.
609 DC gain X1 failed This test configures for the 10 V range. The DC amplifier gain is set to X1.
The measure customer (MC) input is connected to the internal TSENSE source which
produces 0.6 volts. A 20 ms ADC measurement is performed and checked against a limit of
0.6 V ±0.3V.
610 DC gain X10 failed This test configures for the 1 V range. The DC amplifier gain is set to
X10. The measure customer (MC) input is connected to the internal TSENSE source which
produces 0.6 volts. A 20 ms ADC measurement is performed and checked against a limit of
0.6 V ±0.3V.
611 DC gain X100 failed This test configures for the 100 mV range. The DC amplifier gain is set
to X100. The measure customer (MC) input is created from the 1mA current source and
20mV Ohms Clamp circuit with the inputs open. A 20 ms ADC measurement is performed
and checked against a limit of 20 mV ±11 mV.
613 Ohms 5 µA source failed This test configures the 10 V range with the internal 499 Q test
resistor (R109) connected across the input. the 5 µA current source is connected. A 40 ms
ADC measurement is performed and the result is checked against a limit of 0.0025 V
±0.001 V.
614 Ohms 10 µA source failed This test configures the 10 V range with the internal 499 Q test
resistor (R109) connected across the input. The 10 µA current source is connected. A 40 ms
ADC measurement is performed and the result is checked against a limit of 0.005 V
±0.0015 V.
615 Ohms 100 µA source failed This test configures the 10 V range with the internal 499 Q test
resistor (R109) connected across the input. The 100 µA current source is connected.
A 40 ms ADC measurement is performed and the result is checked against a limit of 0.05 V
±0.01 V.
616 Ohms 1 mA source failed This test configures the 10 V range with the internal 499 Q test
resistor (R109) connected across the input. The 1 mA current source is connected. A 40 ms
ADC measurement is performed and the result is checked against a limit of 0.5 V ±0.1 V.
617 Ohms 10 mA source failed This test configures the 10 V range with the internal 499 Q test
resistor (R109) connected across the input. The 10 mA current source is connected. A 40
ms ADC measurement is performed and the result is checked against a limit of 5 V ±1 V.
618 Ohms 20 mV voltage clamp failed This test configures the 10 V range. The 10 mA current
source is connected into an open circuit and the 20 mV ohms clamp voltage is selected and
measured. The result is checked for 20 mV ±10 mV.
619 Ohms 100 mV voltage clamp failed This test configures the 10 V range. The 10 mA current
source is connected into an open circuit and the 100 mV ohms clamp voltage is selected
and measured. The result is checked for 85 mV ±35 mV.
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