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Olympus Vanta iX Series User Manual

Olympus Vanta iX Series
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10-019116-01EN, Rev. 2, January 2021
Appendix B62
B.1 Profile Testing Information
Date: November 17, 2020
Survey Instrument: Ludlum model 2241 (S/N 289346) with probe model 44-3 (S/N
PR326341)
Survey Last Updated: November 10, 2020
B.2 Test Setup and Survey Locations
The following survey locations are indicated on the diagram in Figure B-1 on page 63:
1. Front
2. Scatter plane
3. Left side (front of scatter plane)
4. Right side (front of scatter plane)
5. Front cover seam
Table 12 Maximum Leakage radiation measured at 50 kV in µSv/h
Surveyed location Close 10 cm 30 cm
Front 22.8 7.4 2.6
Left Side (front of scatter plane) 14.3 2.0
BK
a
a. BK
=
background reading (< 1 µSv/h). To convert from µSv/h to mR/h, divide value by 10.
Right Side (front of scatter plane) 9.6 1.9
BK
*
Top (up to front cover seam) 27.6 2.8 1.2
Left Side (behind scatter plane)
BK
*
BK
*
BK
*
Right Side (behind scatter plane)
BK
*
BK
BK
*
Top (rear up to scatter plane)
BK
*
BK
BK
*
Bottom
BK
*
BK
*
BK
*

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Olympus Vanta iX Series Specifications

General IconGeneral
BrandOlympus
ModelVanta iX Series
CategoryMeasuring Instruments
LanguageEnglish

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