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WAGO Pro 2
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2787-2146 (/0000-00x0) Properties
Product manual | Version: 1.2.2 27
Power Supply Pro 2
The following tests have been performed in accordance with the EMC standards listed:
Table37: Standards: EMC – Immunity to Interference (Tests Performed)
Standard Title Test Value Category
EN 61000-4-2 Part 4-2: Testing and measurement
techniques – Electrostatic discharge
immunity test
Contact discharge 6kV B
Air discharge 2kV/4kV/8kV B
EN 61000-4-3 Part 4-3: Testing and measurement
techniques – Radiated, radio-fre-
quency, electromagnetic field immu-
nity test
80MHz … 1.0GHz
(1kHz AM 80%)
15V/m A
1.0… 2.0GHz
(1kHz AM 80%)
12V/m A
2.0… 3.0GHz
(1kHz AM 80%)
5V/m A
EN 61000-4-4 Part 4-4: Testing and measurement
techniques – Electrical fast transient/
burst immunity test
AC input 2kV, 5kHz/100kHz,
5min.
A
DC output 2kV, 5kHz/100kHz,
5min.
A
DC OK/
digital input/
digital output
1kV, 5kHz/100kHz,
5min.
A
Communication 1kV, 5kHz/100kHz,
5min.
A
EN 61000-4-5 Part 4-5: Testing and measurement
techniques – Surge immunity test
L → N 1kV B
L → PE
N → PE
2kV B
L+ → L− 0.5kV B
EN 61000-4-6 Part 4-6: Testing and measurement
techniques – Immunity to conducted
disturbances, induced by radio-fre-
quency fields
AC input 0.15 … 80MHz:
15V
A
DC output 0.15 … 80MHz:
15V
A
DC OK/
digital input/
digital output
0.15 … 80MHz:
15V
A
Communication 0.15 … 80MHz:
15V
A
EN 61000-4-8 Part 4-8: Testing and measurement
techniques – Power frequency mag-
netic field immunity test
50/60 Hz 100A/m A
EN 61000-4-11 Part 4-11: Testing and measurement
techniques – Voltage dips, short in-
terruptions and voltage variations im-
munity tests
0% of 100VAC (50
… 60Hz)
0.5 cycles A
0% of 100VAC (50
… 60Hz)
1 cycle A
40% of 100VAC (50
… 60Hz)
10/12 cycles B
70% of 100VAC (50
… 60Hz)
25/30 cycles A
80% of 100VAC (50
… 60Hz)
250/300 cycles A
0% of 100VAC (50
… 60Hz)
250/300 cycles B
Table38: Legend for “Standards: EMC – Immunity to Interference (Tests Performed)”
Category Description
A Normal operation within specification limits

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