X-Rite Ci7860 Series User Manual

Ci7 XX0 BENCHTOP S P ECTROPHOTOMETER
41
Specifications
Performance Specifications
Ci7860 Series Ci7800 Series Ci7600 Series Ci7500 Series
Repeatability
0.01 RMS ∆E CIELAB
Spectralon Tile
0.01 RMS ∆E CIELAB
Spectralon Tile
0.03 RMS ∆E
CIELAB Spectralon
Tile
0.03 RMS ∆E
CIELAB Spectralon
Tile
Inter
-
Instrument
Agreement
0.06 Avg. 13 BCRA
Series II tiles SCI
(25 mm only)
0.08 Avg. 13 BCRA
Series II tiles SCI
(25 mm only)
0.15 Avg. 13 BCRA
Series II tiles SCI
(25 mm only)
0.15 Avg. 13 BCRA
Series II tiles SCI
(25 mm only)
Geometry
D\8 Tri-beam
simultaneous
SCE\SCI
D\8 Tri-beam
simultaneous
SCE\SCI
D\8 Tri-beam
simultaneous
SCE\SCI
D\8 Tri-beam
simultaneous
SCE\SCI
Illumination
Pulsed Xenon, D65
Calibrated
Pulsed Xenon, D65
Calibrated
Pulsed Xenon, D65
Calibrated
Pulsed Xenon, D65
Calibrated
Measurement
time
2.7 – 4.0 seconds
(flash & data
acquisition)
2.7 – 4.0 seconds
(flash & data
acquisition)
2.7 – 4.0 seconds
(flash & data
acquisition)
2.7 – 4.0 seconds
(flash & data
acquisition)
Duty cycle
480 measurements
per hour max
480 measurements
per hour max
480 measurements
per hour max
480 measurements
per hour max
Spectral
Range
360 to 750 nm
standard reporting
with 360 to 780 nm
extended range
360 to 750 nm
standard reporting
with 360 to 780 nm
extended range
360 to 750 nm
standard reporting
360 to 750 nm
standard reporting
Wavelength
Interval
5 nm, 10 nm, and
20 nm
5 nm, 10 nm, and
20 nm
10 nm and 20 nm 10 nm and 20 nm
Photometric
range
0.0% to 200% 0.0% to 200% 0.0% to 200% 0.0% to 200%
Photometric
resolution
0.001% reflectance 0.001% reflectance 0.01% reflectance 0.01% reflectance

X-Rite Ci7860 Series Specifications

General

Brand	X-Rite
Model	Ci7860 Series
Category	Measuring Instruments
Language	English