Agilent Technologies 4263B - Page 245

4263B
Ls-Rdc,
Lp-Rdc,
L2-R2 modes
Total
Measurement Time
[ms] =
Td
+120
+ Tzm1
+T
dcr
(0

T
d
<
40
ms)
Total
Measurement Time
[ms] =
4 2
Td
+Tzm1
+T
dcr
(T
d

40
ms)
Where,
Td
is the
trigger delay
time [ms].
Tzm1 is
given in
Table
8-4.
Tdcr
is given
in T
able 8-6
.
Table
8-6. A
dditional Measurement
Time for
Rdc
Measurement
Measurement
Time
Mode
T
dcr
Short 80
ms
Medium 400 ms
Long 1680
ms
L2-N,
L2-1/N,
L2-M
modes
T
otal
Measurement
Time
[ms]
=
T
d
+
Tzm1
+
Tnm
Where
,
T
d
is
the
trigger
delay
time
[ms].
Tzm1
is
given
in T
able 8-4
.
Tnm
is given
in
T
able
8-7
.
T
able
8-7.
A
dditional
Measurement
Time
for
N
and
M
Measurement
Measurement
Time
Mode
Tnm
N

approx.
10
N

approx.
10
Short 30
ms
60
ms
Medium 80
ms
160
ms
Long 500 ms 1000 ms
Maximum
DC
Bias
Current
Measurement
Range
Maximum
DC
Bias
Current
0.1

to
100

100
mA
1
k,
10
k
1
mA
100
k, 1
M
10
 A
DC Bias Settling Time
The
time for the DUT to be charged 99.9% is as follows:
35 + 700000
2 C [ms] (@ Measurement range
 10
)
35 + 175000
2 C [ms] (@ Measurement range
 1)
Where, C is the DUT's capacitance value [F].
Continuous Memory Duration
72 hours (@ 23 6 5

C)
8-16 Specications