Index
Service Guide N5230-90014 Index-11
standard, 2-10
three-year return to Agilent
,
2-10
shipment for service or repair
,
2-11
signal separation
functional description of, 5-4
functional group
, 5-3
signal separation group
defined, 4-29
operation
, 5-15
troubleshooting
, 4-42
signal separation group, active
block diagram, 5-17
signal separation group, passive
block diagram, 5-15
single band failure
, 4-36
software
options, 8-15
source
calibration, 3-37
functional group
, 5-3
maximum output power test
,
3-29
power accuracy test
, 3-28
power linearity test
, 3-29
source attenuator
description of, 2-4
illustrated
, 6-19
operation
, 5-16
part number, 6-18
removal and replacement
illustrated
, 7-31
procedure, 7-30
source group
block diagram, 5-7
defined
, 4-29
operation, 5-6
troubleshooting
, 4-31
source match
cause of failure, 8-11
definition of
, 8-11
measurements affected by
, 8-11
SPAM board
illustrated, 6-11
operation
analog
, 5-19
digital
, 5-24
part number
, 6-10
removal and replacement
illustrated
, 7-17
procedure
, 7-16
troubleshooting
, 4-45
speaker
front panel, 5-23
troubleshooting, 4-16
specifications
instrument, 3-6
stabilization, warm up time
, 3-4
system
, 3-6
SSLAM
illustrated, 6-15, 6-19
operation, 5-9, 5-16
part number
, 6-14, 6-18
removal and replacement
illustrated
, 7-25
procedure
, 7-24
troubleshooting
, 4-44
stabilization
warm up time, 3-4
standards compliant calibration
built-in tests, Option 898, 2-5
standards compliant calibration,
Option R-50C-002
, 2-10
static safety parts
required for servicing, 2-9
step attenuator, source
illustrated, 6-19
operation
, 5-16
part number
, 6-18
port 1
troubleshooting
, 4-44
port 2
troubleshooting
, 4-44
removal and replacement
illustrated
, 7-31
procedure, 7-30
storage data
IDE, 5-25
strap handle
analyzer
illustrated, 6-29
part number
, 6-28
subgroup
data acquisition and processing,
5-21
front panel
, 5-21
subnet mask, LAN
, 4-22
substitution
cable, 3-23
calibration kits
, 3-23
verification kits
, 3-23
supplies
EMI/RFI
part numbers
, 6-35
ESD
part numbers
, 6-35
memory modules
part numbers
, 6-35
support
contacting Agilent, 2-11
options
, 2-10
organization
, 2-10
synthesized source
functional description of, 5-4
synthesized source group
operation, 5-6
system
adjustments, 3-1, 3-35
frequency at 10 MHz
, 3-35
getting ready, 3-4
LO power
, 3-36
receiver calibration
, 3-38
source calibration, 3-37
checks
, 3-1
getting ready
, 3-4
operating
recovery
, 8-19
specifications
, 3-6
verification, 3-1, 3-7, 3-19
dialog box
, 3-23
example of results
, 3-26, 3-27
failure flowchart
, 3-25
failure of
, 3-25
getting ready
, 3-4
interpreting results, 3-26
performing
, 3-22
procedure
, 3-23
what it verifies, 3-19
system motherboard
illustrated, 6-11
operation
, 5-23
part number, 6-10
removal and replacement
illustrated
, 7-19
procedure, 7-18
troubleshooting
, 4-11
T
test
calibration coefficients, 3-33
dynamic accuracy, 3-34
frequency accuracy
, 3-30
noise floor
, 3-32
performance
frequency accuracy
, 3-30
source maximum power
output
, 3-29
source power accuracy
, 3-28
test port maximum power
output
, 3-29
test port power accuracy
, 3-28
receiver compression
, 3-31
source power linearity
, 3-29
test port output power linearity
,
3-29
trace noise
, 3-30
test equipment
required for service, 2-7
required for servicing
, 2-7
test port
cable checks
connector repeatability
failure
, 3-18
dynamic accuracy test, 3-34