BAS 100B/W - List Run Data; Ir COMPENSATION

5-3
leaving just the data values. Note: Car. Ret + Linefeed format works differently
than the other formats--it saves an exact copy of all lines listed on the screen
during each run.
c) The data from single experimental runs can be save automatically by clicking
Auto-save data for single runs. The Path and Base Filename must be specified.
d) Clicking Enter label before saving data allows the user to specify a label for the
data file of the experiment just run (a dialog box is displayed after each run). This
can be used for both single and multiple runs. However, for multiple runs, the
time available for entering the label is limited by the Time Interval. If it is less
than 10 seconds, this option is not available. For longer Time Intervals, once the
time has expired, the data are saved with whatever label has been entered, and the
next run is then started. After a label has been entered, and [OK] has been
clicked, the standard timer dialog box appears to count down any excess time that
remains.
5.6 List Run Data
When this command is checked in the menu, the experimental data are listed on the
screen during runs if the data rate is slow enough (as determined by the software) to
allow time for listing.
5.7 iR Compensation
In any potentiostatic experiment, it is assumed that the potential drop across the
interfacial region at the working electrode is the same as the potential applied
between the reference and working electrode. However, this is not true, since there is
some iR drop between these two electrodes due to solution resistance. This resistance
can be lowered by addition of supporting electrolyte, and in many cases does not
need to be considered. However, there are instances where it is detrimental to the
experiment; in these cases, it can be compensated for electronically. On the BAS
100B/W, this is achieved by the iR Compensation command.
There are two stages to Auto iR Compensation on the BAS 100B/W (P. He and L.R.
Faulkner, Anal. Chem. 58 (1986) 523):
a) measurement of the uncompensated resistance
b) compensation and circuit stability testing