Benning IT 110 - Trip-Out Time; Trip-Out Current

59
Test current max. 0.5×I
∆N
Limit contact voltage 25 V, 50 V
Fault loop resistance at contact voltage is calculated as:
∆N
C
L
I
U
R =
.
R
L
:0.00Ω-10.00KΩ
9.3.3 Trip-out time
Measuring ranges according to EN61557
General (non-delayed) RCDs
Measuring range (ms) Resolution (ms) Accuracy
0 - 300 (½×I
∆N
, I
∆N
) 1
± 3 ms0 - 150 (2×I
∆N
) 1
0 - 40 (5×I
∆N
) 1
Selective (time-delayed) RCDs
Measuring range (ms) Resolution (ms) Accuracy
0 - 500 (½×I
∆N
, I
∆N
) 1
± 3 ms0 - 200 (2×I
∆N
) 1
0 - 150 (5×I
∆N
) 1
Test current ½×I
∆N
, I
∆N
, 2×I
∆N
, 5×I
∆N
The multiplier 5 × I
∆N
is not available for I
∆N
= 1000 mA (FI/RCD of type AC) or I
∆N
≥300mA(FI/
RCD of types A, B).
The multiplier 2 × I
∆N
is not available for I
∆N
= 1000 mA (FI/RCD of type A) or I
∆N
≥300mA(FI/RCD
of type B).
The multiplier 1 × I
∆N
is not available for I
∆N
= 1000 mA (FI/RCD of type B).
9.3.4 Trip-out current
Measuring ranges according to EN61557
Trip-out current (I
∆N
= 10 mA)
Measuring range I
∆
Resolution I
∆
Accuracy
0.2×I
∆N
- 1.1×I
∆N
(AC type) 0.05×I
∆N
±0.1×I
∆N
0.2×I
∆N
- 2.2×I
∆N
(A type) 0.05×I
∆N
±0.1×I
∆N
0.2×I
∆N
- 2.2×I
∆N
(B type) 0.05×I
∆N
±0.1×I
∆N
Trip-out current (I
∆N
≥ 30 mA)
Measuring range I
∆
Resolution I
∆
Accuracy
0.2×I
∆N
- 1.1×I
∆N
(AC type) 0.05×I
∆N
±0.1×I
∆N
0.2×I
∆N
- 1.5×I
∆N
(A type) 0.05×I
∆N
±0.1×I
∆N
0.2×I
∆N
- 2.2×I
∆N
(B type) 0.05×I
∆N
±0.1×I
∆N
Measurement range according to EN61557-6
Trip-out measurement is not available for I
∆N
= 1000 mA (RCD type B)