clare H101 - Page 32

The second column holds the t
test
ramp profile t
times
(3 fields) for
completing a level of test sequence:
Time up or Ramp Time (to terminal voltage)
Time Hold (for the test at terminal voltage)
Time Down (for final terminal voltage)
The third column indicates the t
termi
nal vol
t
age (corresponds to Time
up) that the test should ramp to after the ramp up time is reached, and
the second voltage (corresponds to Time Down) is the f
inal t
ermination
voltage
(usually 0.00KV). But this value can be selected to be
“Maintained” to sustain the terminal voltage for execution to the next
level of test sequence after the first test time sequence has completed.
This is done by highlighting the Time Down, press Rotate Field and
select “Maintained” using encoder.
The fourth column holds the l
leakage limit
values, low (top) and high
(bottom) respectively. A low value is used to ensure that the EUT is
correctly connected.
Next the icon (a lightning flash with a number) denotes the A
Arc level
for
the test. A level of 1 is the most sensitive to arcs, with 9 the least
sensitive, and X disables the feature.
The circular icon with a number in the centre denotes the number of
repeats
(loops) for the test. This icon can be joined to other levels of
test sequence for different combinations of loops cycle for different
unique test sequences, see e.g. below
(Fig. A) (Fig. B)
Fig. A shows that the first test sequence (50Hz Hipot test) will convene
twice before going on to the second test sequence (60Hz Hipot test) for
twice. Where as,
Fig. B shows that the first test sequence (50Hz Hipot test) will convene
once then proceeds to second test sequence (60Hz Hipot test) once
and then the process is repeat again once through.
age)
n
a
l
v
o
l
g
e
(c
he ramp up
e Down)
lue c
age fo
rresponds to T
e is reached,
f
i
n
a
l
t
ds) for
(50Hz
quence
e thro
z Hipot
(60Hz H
h
test) wi
pot test
vene
t) for
leve
This
se
aintaine
el of test
is done
“M
usually
ed” to s
seque
hould
ge (corr
0.00KV
ustain
es
ramp
respo
V).
The
com
Fig
on
and t
A shows
ce before go
ice. Where as,
B shows that
then proce
en the
A)
at the first test
ng on to the se
seque
ond te
the
ed to other l
ps cycle for d
mber
vels o
fferent
(bo
cor
Next t
th
sen
T
h a nu
se
used to
be
lues, lo
o ensure
ow (top
e that
e Fie
an