Repetitive
Sampling: Up to 100 Msa/s equiv.
sample rate (10 ns be
-
tween samples)
Continuous
Single Period: Yes, from LF to 0.5 MHz
repetition rate
Waveform
Capture: Yes
Data Analysis
Features: Measurement data vs
time
FFT graph w. Hamming,
Hanning and other rele
-
vant filters
Root Allan variance
Smoothing
Zoom
Cursor measurements
Distribution histogram
Setup, measurement data
archive and printing
Measurement
Uncertainties
Random Uncertainties
n
Quantization Error (E
q
)
E
q
= 100 ps rms
n
Start/Stop Trigger Error (E
ss
)
E
ss
Vnoise input Vnoise signal
Signal slew rate
=
-+-()( )
22
()
V
s
at trigger point
s
rms
Vnoise-input: 200 mV
rms
typical internal
noise
V
noise-signal: The rms noise of the
applied signal
Systematic Uncertainties
n
Trigger Level Timing Error (E
tl
)
Time Interval, Rise/Fall Time, Pulse Width,
Duty Factor (x1)
E
tl
= TLU x (1/Sx + 1/Sy) ± 0.5 x Hyst x (1/Sx
+1/Sy)
[s]
where:
Sx = Slew rate at start trigger point (V/s)
Sy = Slew rate at stop trigger point (V/s)
TLU = Trigger level uncertainty (V)
Hyst = Hysteresis window (V); Hyst = 5 mV
± 1 % of set trigger level (DC to1 kHz)
Phase with sinusoidal signals and trigger
levels = 0 V (x1)
E
tl
= 0.001/V
pk (A)
+ 0.001/V
pk (B)
[°]
where:
V
pk (A)
= Input A peak voltage in V
V
pk (B)
= Input B peak voltage in V
n
Display Resolution
LSD Displayed
Unit value of the least significant digit dis
-
played. All calculated LSDs should be
rounded to the nearest decade (e.g. 0.3 Hz is
rounded to 0.1 Hz, 5 Hz is rounded to 10 Hz)
and cannot exceed the 14th digit.
Frequency & Period
LSD
displ
=
´(/)Resolution Measurement Result
Measuring Time
2
Resolution in s.
Time Interval, Rise/Fall Time,
Pulse Width & Ratio
LSD
displ
= Resolution /2
Duty Factor
LSD
displ
=´
-
110
6
Measurement Uncertainties 8-9
Specifications