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GE LOGIQ E9 - Page 292

GE LOGIQ E9
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GE
D
IRECTION 5535208-100, REV. 2 LOGIQ E9 SERVICE MANUAL
7 - 44 Section 7-5 - Common Service Desktop
7-5-8-2 Memory (cont’d)
Assesses the general state of the system. Tests the integrity of memory and communication of the
described boards. Tests all of the on-board memory, including registers. The utility fills the memory with
data, retrieves the data, and compares it to the original data.
Name: GFI Memory Access Test
Description: Tests the internal and external RAM of the GFI Board.
NOTE: There may be multiple board dependencies causing this test to fail. Also, see the FDEMOD
Signal Test, 7-5-8-1 "Digital Receive" on page 7-40.
Run Time: 00:01
If this test failed:
1.) Replace the GFI board.
Name: DRX IF FPGA Memory Test
Description: Tests memory of Interface FPGAs on the DRX boards
NOTE: Also run the DRX Memory Test (next test below) for a full range of testing capacity.
Run Time: 00:01
If this test failed:
1.) Replace the failed DRX board.
Name: DRX Memory Test
Description: Tests the memory of the Nathan ASICs on the DRX Boards.
Run Time: 00:01
If this test failed:
1.) Replace the failed DRX board.

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