GE LOGIQ V1

Diagnostics/Troubleshooting
8-16 LOGIQ V2/LOGIQ V1 – Basic Service Manual
5610739-100 English Rev.10
Service Diagnostics (continued)
System
• MST Temperature Test.
• CPS Temperature Test.
• CPU Temperature Test.
• MST Voltage Test.
• CPS Voltage Test.
• FPGA Version Test.
• HV_STOP Test: tests HV-STOP mechanism and checks
each board is able to assert HV_STOP using its HV_STOP
source.
Memory
• Callisto Memory Test.
NOTE: The Callisto Memory test may fail if it is performed with other
tests at the same time.
AnalogReceive
• Noise Floor Test.
• BF Analog Rx Gain (High)
• BF Analog Rx Gain (Med)
• BF Analog Rx Gain (Low)
AnalogCW
• aCW IQ Symmetry Test
• aCW beamforming test
• aCW IQ Symmetry test
Digital Receive
• AFE IF Test
• Complex Mixer Test
• CE Decoder Test