HP 5334B - 4-37. TIME INTERVAL A TO B DELAY TEST

4.
Record the Time Internal measurement on the Performance Test Record, line 35.
Failure: If the instrument under test does not meet the test specification, consider performing the adjustments in
Section
V of this manual as a first step in correcting the problem.
4-37.
TIME INTERVAL A TO B DELAY TEST
Specification: Refer to Table 1-1, HP Model 5334B Specifications, for T.I. A to B Delay specification.
Description: Operation of the time interval delay circuitry is verified by introducing a delay into a frequency
measurement.
HP3325A
SYNTHESIZER/
FUNCTION
GENERATOR REF IN
.................
00000
=.. == ooooo
OOOClO
I
TSIl-LZ
Figure 4-11. Time Interval A to B Delay Test Sehrp
Equipment:
Function Generator .............................................................................................. HP 3325A
Procedure:
.1.
Set the function generator as follows:
Frequency
............................................................................................................... 100 Hz
.............................................................................................................. Amplitude 2 mV p-p
.................................................................................................................
Function Square Wave
HP 5334B - Scrvice Manual
4-29