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General| Brand | HP |
|---|---|
| Model | 5334B |
| Category | Cash Counter |
| Language | English |
Review product and documentation for safety markings and instructions before operation.
Verify product settings match line voltage and correct fuse is installed before applying power.
Ensure an uninterruptible safety earth ground from the mains power source to the product.
Overview of three test groups for HP 5334B operation verification and performance.
Lists necessary test equipment and allows for suitable substitutions.
Records used for documenting operational verification and performance test results.
Suggests yearly checks and oscillator adjustments for optimal operating condition.
Assumes operator familiarity with test equipment and procedures for counter operation.
Tests to ensure instrument operability and operator confidence.
Instrument's automatic self-test during power-up to check major components.
Checks READ LEVELS function to assess health of critical counter circuits.
Tests time base oscillator and input amplifiers for the Multiple-Register Counter.
Measures frequency to exercise interpolators and test accuracy.
Performs functional test of front panel relays and associated circuitry.
Verifies slope switch operation for time interval measurements.
Tests MCU signal to DAC block and disabling of front panel trigger controls.
Operationally checks Channel C option by measuring frequencies within its range.
Tests electrical performance against specifications, more rigorous than operational verification.
Tests frequency measuring range at minimum sensitivity and four frequency settings.
Tests Channel B's frequency range at minimum sensitivity and four frequency settings.
Tests Channel A's frequency range at minimum sensitivity and two frequency settings.
Tests Channel B's frequency range at minimum sensitivity and two frequency settings.
Tests Channel A with Option 060, covering front and rear inputs at minimum sensitivity.
Tests Channel B with Option 060, covering front and rear inputs at minimum sensitivity.
Verifies minimum specified period measurement using a 100 MHz input signal.
Measures pulse width to verify the counter's performance.
Verifies time interval measuring accuracy using a known generated signal.
Verifies time interval delay circuitry operation by introducing a delay.
Applies two frequencies to A and B inputs to display the ratio.
Exercises Rise/Fall time function at different frequencies and slope settings.
Tests Channel C with Option 030 at various frequencies and signal levels.
Checks counter's ability to process or send HP-IB messages.
Provides adjustments and checks for HP 5334B, used after part replacement or failure.
Contains safety information, cautions, and warnings for instrument operation and maintenance.
Adjusts the +3V DC power supply to +3.00V dc ± 0.02V dc.
Sets zero reference positions for Channel A/B DAC trigger levels with no input signal.
Sets voltage reference levels for Channel A/B DACs using a high-resolution DC voltage input.
Adjusts internal 10 MHz oscillator time base frequency to a reference standard.
Adjusts Channel A input sensitivity using a 1 MHz input signal.
Adjusts Channel B input sensitivity using a 1 MHz input signal.
Optimizes Channel A DC biasing level on MRC input signal at two frequencies.
Optimizes Channel B DC biasing level on MRC input signal at two frequencies.
Adjusts Channel A and B attenuators for low frequency applications.
Adjusts the input sensitivity of Channel C.
Contains part ordering information, abbreviations, and replaceable parts listing.
Lists abbreviations used in parts lists, schematics, and throughout the manual.
Provides details on ordering parts, including direct mail order system advantages.
Provides information to adapt the manual for older instruments.
Lists changes made to the manual to reflect instrument revisions.
Details changes to A1 Main Board components and schematic for a specific date code.
Details changes to chassis parts and option parts for Series 2937A.
Details changes to A1 Main Board parts and schematics for Series 2839A.
Details changes to A2 Front Panel Board and Chassis Parts for Series 2826A.
Details changes for instruments with Revision B and C A1 Main Board Assembly.
Details changes for instruments with Revision B, only, A1 Main Board Assembly.
Introduces circuit descriptions, troubleshooting, block diagrams, schematics, and component locators.
Provides essential safety information, cautions, and warnings for instrument operation and maintenance.
Divides circuit descriptions into overall explanations and detailed component-level descriptions.
Outlines troubleshooting methods including Signal Tracing and Signature Analysis.
Lists recommended equipment for service, allowing substitutions if performance meets specifications.
Details parts locations, adjustment/test point locations, service aids on PCBs, and screwdriver usage.
Covers repair procedures including cleaning PCBs and disassembly/reassembly.
Explains symbols, reference designators, assembly numbers, and subassembly numbers in schematics.
Conforms logic symbols to ANSIIIEEE Std. 91-1984, covering gate and qualifying symbols.
Defines characters used to specify device function within logic symbols.
Defines ANSI/IEEE standard symbols for gate functions.
Shows symbols indicating external states of gate and logic devices and their relation to internal states.
Illustrates symbols for internal connections between logic symbol elements.
Details symbols used inside logic symbol outlines, including outputs and enable inputs.
Simplifies IC symbols by denoting relationships between inputs, outputs, and interconnections.
Explains the use of common control blocks for arrays of related elements.
Demonstrates combining logic symbols to represent complex devices using a transceiver example.
Lists high and low logic levels for TTL, ECL, and EEL device logic.
Describes the general operation of the HP 5334B and the function of each block assembly.
Controls overall instrument operation, scanning keyboard and updating display.
Executes measurement functions under MCU control and configures input amplifiers.
Contains matched amplifier circuits for Channel A and B, buffering and shaping signals.
Converts digital codes to analog voltages for setting amplifier sensitivity and trigger levels.
Provides a buffered 10 MHz reference signal from internal or external sources.
Handles HP-IB interfacing, decoding commands, and managing data transfer.
Provides regulated DC voltages and an unregulated voltage for instrument distribution.
Extends frequency range to 1.3 GHz by conditioning and dividing input signals.
Allows MATE system operation and CIIL command translation via HP-IB.
Provides a stable 10 MHz source with high stability timebase, mounted in insulated housing.
Provides front panel controls and displays for counter functions, diagnostics, and failures.
Provides detailed operational theory for each assembly, referencing schematic diagrams.
Contains matched amplifier circuits for Channel A and B, buffering and shaping signals.
Details signal conditioning, attenuation, filter, and separate/common path functions for Channel A.
Consists of parallel buffering circuits for high and low frequencies with AC gain.
Converts analog signals to square waves and provides variable sensitivity control.
Translates ECL signals to TTL levels for driving MRC input and front panel trigger light.
Converts digital codes to analog voltages for trigger level, sensitivity, and reference settings.
Controls overall instrument operation, scanning keyboard and updating display.
Performs measurement functions and data manipulation, controlling DAC and Channel C blocks.
Provides a buffered 10 MHz reference signal for measurements.
Handles HP-IB interfacing, decoding commands, and managing data transfer.
Describes the reset controller that synchronizes microcomputers during power-up.
Provides regulated DC voltages and an unregulated voltage for instrument distribution.
Extends frequency range to 1.3 GHz by conditioning and dividing input signals.
Details signal conditioning, amplifier, divider, peak detector, and comparator circuits.
Contains display and keyboard circuitry for controls and results display.
Allows MATE system operation and CIIL command translation via HP-IB.
Details clock/logic driver, address latch, data buffer, and read/write decode logic for MATE.
Provides a stable 10 MHz source with high stability timebase, mounted in insulated housing.
Provides procedures for disassembling and reassembling the instrument.
Guides troubleshooting, divided into Signal Tracing and Signature Analysis.
Provides precautions to prevent damage to static-sensitive components.
Explains using multimeters and oscilloscopes to measure signals and observe waveforms.
Details methods for troubleshooting the power supply, including voltage and resistance checks.
Addresses possible failures in the Input Amplifier, including signal conditioning and amplifier stages.
Checks AC/DC coupling function by measuring signals at the coupling selector relay.
Checks input impedance function by measuring resistance at the connector.
Checks attenuation function by measuring signal amplitude at different settings.
Checks COMMON/SEPARATE A function by measuring resistance across relay contacts.
Checks Filter A function by measuring amplitude at the filter relay junction.
Checks high frequency path by measuring signals at specific test points.
Checks low frequency path by measuring signals at specific test points.
Checks trigger level function by measuring voltage at the emitter of Q10.
Addresses failures related to DAC zero/gain adjustments and READ LEVELS functions.
Troubleshoots the polarity switch (U26A) and trigger level switch (U27C).
Guides troubleshooting using failure messages and isolating MCU or communication problems.
Checks RATIO A/B measurement by connecting time base output to Channel A input.
Troubleshoots RATIO measurement failures by checking time base signal and inputs.
Identifies failure categories for Executive Block and suggests Signature Analysis.
Addresses display and keyboard issues, suggesting diagnostics and individual display replacement.
Addresses the single failure mode related to the Time Base block's oscillator presence.
Provides procedures for troubleshooting the Option 010 oven oscillator.
Describes a special connector for troubleshooting and alignment of the oven oscillator.
Categorizes oscillator and oven circuitry failures into output issues and current/stability problems.
Provides steps for disassembling the oscillator unit for troubleshooting.
Guides troubleshooting for the oven controller section, including general operation and current limits.
Describes oscillator circuits, troubleshooting outline, and helpful hints.
Addresses troubleshooting for the absence of output from the oscillator circuit.
Addresses incorrect output amplitude, often related to AGC adjustment.
Details adjusting output amplitude using the AGC feedback variable resistor.
Addresses excessive frequency drift, possibly due to crystal or tuning components.
Guides HP-IB block troubleshooting via failure messages and supply voltage checks.
Explains signature analysis for troubleshooting digital circuitry, including setup and probe connections.
Details MATE Block troubleshooting using self-tests and signature analysis.
Provides instructions for field installation of the Option 010 Oven Oscillator.
