HT PVCHECK - PV Module Database Operations; PV Module Database Overview; Adding a New PV Module to Database

PVCHECK
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5.6. DB – DATABASE MODULE MANAGEMENT
The meter allows managing up to a maximum of 30 different types of PV modules, further to a
DEFAULT module (not editable and not erasable) which can be used as reference case when no
piece of information about the type of module being tested is available.
The parameters, referred to 1 module, which can be set are described below in Table 1 together
with their measuring range, resolution and validity condition.
Symbol
Description
Range
Resol.
Conditions
Nms
Number of modules per string
1 ÷ 50
1
Pmax
Maximum rated power of module
50 ÷ 3200W
1W
Voc
Open-circuit voltage
15.00 ÷ 99.99V
100.0 ÷ 320.0V
0.01V
0.1V
Voc ≤ Vmpp
Vmpp
Voltage on maximum power point
15.00 ÷ 99.99V
100.0 ÷ 320.0V
0.01V
0.1V
Voc ≤ Vmpp
Isc
Short-circuit current
0.5 ÷ 9.99A
0.01A
Isc ≤ Impp
Impp
Current on maximum power point
0.5 ÷ 9.99A
0.01A
Isc ≤ Impp
Toll -
Negative tolerance for Pmax
provided by the module
manufacturer
0% ÷ 25.0%
0.1%
100*Tol
-
/ Pnom< 25
0 ÷ 99W
1
Toll +
Positive tolerance for Pmax
provided by the module
manufacturer
0 ÷ 25%
0.1%
100*Tol
+
/ Pnom< 25
0 ÷ 99W
1
Alpha
Isc temperature coefficient
-0.100 ÷0.100%/°C
0.001%/°C
0.1*Alfa / Isc ≤ 0.1
-9.99 ÷ 9.99mA/°C
0.01mA/°C
Beta
Voc temperature coefficient
-0.99 ÷ -0.01%/°C
0.01%/°C
100*Beta/Voc ≤ 0.999
-0.999 ÷ 0.001V/°C
0.001V/°C
Gamma
Pmax temperature coefficient
-0.99 ÷ -0.01%/°C
0.01%/°C
NOCT
Rated working temperature of cell
0 ÷ 100°C
1°C
Tech.
Effects due to module technology
STD (standard),
CAP (capacitive
eff.)
Rs
Internal serial resistance
0.00 ÷ 10.00Ω
0.01Ω
Table 1: Typical parameters of PV modules
CAUTION
 “Tech” is referred to the choice of the technology of the module being tested. Select
the “STD” option in case of test on “STANDARD” PV modules or the “CAP” option in
case of test on PV modules with remarkable capacitive effects (e.g. HIT/HIP
technology).
 A wrong choice of the type of technology can lead to a negative outcome of the final
test.