Service 6
Keysight 34970A/34972A Service Guide 181
608 Serial configuration readback failed This test re-sends the last 9 byte serial
configuration data to all the serial path. The data is then clocked back into
A1U209 and compared against the original 9 bytes sent. A failure occurs if the
data do not match.
609 DC gain x1 failed This test configures for the 10 V range. The DC amplifier gain is
set to X1. The measure customer (MC) input is connected to the internal TSENSE
source which produces 0.6 volts. A 20 ms ADC measurement is performed and
checked against a limit of 0.6 V ± 0.3 V.
610 DC gain x10 failed This test configures for the 1 V range. The DC amplifier gain is
set to X10. The measure customer (MC) input is connected to the internal TSENSE
source which produces 0.6 volts. A 20 ms ADC measurement is performed and
checked against a limit of 0.6 V ± 0.3 V.
611 DC gain x100 failed This test configures for the 100 mV range. The DC amplifier
gain is set to X100. The measure customer (MC) input is connected to the internal
TSENSE source which produces 0.6 volts. A 20 ms ADC measurement is
performed and checked for a + overload response.
612 Ohms 500 nA source failed This test configures to the 10 V DC range with the
internal 10 M 100:1 divider A4U102 connected across the input. the 500 nA Ohms
current source is connected to produce a nominal 5 V signal. A 20 ms ADC
measurement is performed and the result is checked against a limit of 5 V ± 1 V.
613 Ohms 5 µA source failed This test configures the 10 V range with the internal 10
M 100:1 divider A4U102 connected across the input. The
5 µA current source is connected. The compliance limit of the current source is
measured. A 20 ms ADC measurement is performed and the result is checked
against a limit of 7.5 V ± 3 V.
614 DC 300V zero failed This test configures the 300 V DC range with no input
applied. A 20 ms ADC measurement is performed and the result is checked
against a limit of 0V ± 5 mV.
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