Mitsubishi Electric MELSEC iQ-R-R6SFM - Page 161

10 TEST FUNCTION
10.2 Device test with execution conditions
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10
Data that can be set
The following tables list the data that can be set for the device test with execution conditions.
■Devices that can be set
*1 For bit devices, digit specification is allowed for K1 to K8 only.
*2 For word devices, bit specification is allowed.
*3 A local device, indirectly-specified device, or index-modified device can also be specified. However, a device modified with a local index
register cannot be specified.
■Labels that can be set
*1 Only labels that exist in the read project can be specified.
*2 Labels of a program block can be specified.
*3 Digit-specified labels cannot be specified.
*4 Bit specification is allowed.
*5 Specify the array element.
*6 Specify the structure member.
Type Device
*3
Bit device
*1
X, DX, Y, DY, M, L, F, SM, V, B, SB, T (contact), ST (contact), C (contact), LT (contact), LST (contact), LC (contact), FX, FY, Jn\X,
Jn\Y, Jn\SB, Jn\B
Word device
*2
T (current value), ST (current value), C (current value), D, SD, W, SW, RD, R, ZR, Z, FD, Un\G, Jn\W, Jn\SW, U3En\G, U3En\HG
Double-word device LT (current value), LST (current value), LC (current value), LZ
Type
*1*2
Class Data type
Global label • VAR_GLOBAL
• VAR_GLOBAL_RETAIN
■Primitive data type
•Bit
*3
• Word (signed)
*4
• Double word (signed)
• Word (unsigned)
*4
• Double word (unsigned)
• Single-precision real number
• Double-precision real number
• Timer type
• Retentive timer type
• Counter type
• Long timer type
• Long retentive timer type
• Long counter type
■Array
*5
■Structure
*6
Local label • VAR
• VAR_RETAIN