Siemens SICAM - Page 164

Modbus Register Address Parameter Individual Test Value
260 TP_I
N
_Min_1_Year 260
261 TP_P1_Min_1_Year 261
262 TP_P2_Min_1_Year 262
263 TP_P3_Min_1_Year 263
264 TP_Q1_Min_1_Year 264
265 TP_Q2_Min_1_Year 265
266 TP_Q3_Min_1_Year 266
267 TP_S1_Min_1_Year 267
268 TP_S2_Min_1_Year 268
269 TP_S3_Min_1_Year 269
270 TP_I
1
_Max_1_Year 270
271 TP_I
2
_Max_1_Year 271
272 TP_I
3
_Max_1_Year 272
273 TP_I
N
_Max_1_Year 273
274 TP_P1_Max_1_Year 274
275 TP_P2_Max_1_Year 275
276 TP_P3_Max_1_Year 276
277 TP_Q1_Max_1_Year 277
278 TP_Q2_Max_1_Year 278
279 TP_Q3_Max_1_Year 279
280 TP_S1_Max_1_Year 280
281 TP_S2_Max_1_Year 281
282 TP_S3_Max_1_Year 282
Table B-22 Analog Input Registers Events
Modbus Register Address Parameter Individual Test Value
299 Reserved for future use 299
300 Event counter 300
301 Event type (EVENT 0) 301
302 Time in ms 302
303 Time in hh and mm 303
304 Time in dd and month 304
305 Time in year 305
306 Phase current I
1
306
307 Phase current I
2
307
308 Phase current I
3
308
309 Ground current I
N
309
310 Reserved 0
311 Event type (EVENT 1) 311
312 Time in ms 312
313 Time in hh and mm 313
314 Time in dd and month 314
315 Time in year 315
316 Phase current I
1
316
317 Phase current I
2
317
Modbus Registers
B.9 Self-Test Mode
164 SICAM, Feeder Condition Monitor, Manual
E50417-H8940-C580-A4, Edition 03.2019