Texas Instruments CC2500 User Manual

CC2500
S
WRS040
C
Page
81
of
89
0x2B: AGCTEST
–
AGC
T
est
Bit
Field Name
Reset
R/W
Description
7:0
AGCTEST[7:0]
63
(0x3F)
R/W
For test only. Do not write to this register.
0x2C: TEST2
–
Various
T
est
S
ettings
Bit
Field Name
Reset
R/W
Descr
iption
7
:0
TEST2[7:0]
136 (0x88)
R/W
Set to 0x81
for improved sensitivity at data
rates
≤100 kBaud
. The
temperature range is then from 0
o
C to +85
o
C.
0x2D: TEST1
–
Various
Test Settings
Bit
Field Name
Reset
R/W
Description
7
:0
TEST1[7:0]
49 (0x31)
R/W
S
et to 0x35
for improved sensitivity at data rates
≤100 kBaud
. The
temperature range is then from 0
o
C to +85
o
C.
0x2E: TEST0
–
Various
Test Settings
Bit
Field Name
Reset
R/W
Description
7:2
TEST0[7:2]
2 (0x02)
R/W
The value to use in this register is give
n by the
SmartRF

Studio
software
[5]
.
1
VCO_SEL_CAL_EN
1
R/W
Enable VCO selection calibration stage when 1
0
TEST0[0]
1
R/W
The value to use in this register is given by the
SmartRF

Studio
software
[5]
.
32.3
Status
R
egister
D
etails
0x30 (0xF0): PARTNUM
–
Chip ID
Bit
Field Name
Reset
R/W
Description
7:0
PARTNUM[7:0]
128 (0x80)
R
Chip part number
0x31 (0xF1): VERSION
–
Chip ID
Bit
Field Name
Reset
R/W
Description
7:0
VERSION[7:0]
3 (0x03)
R
Chip version number.
0x32 (0xF2): FREQEST
–
Frequency Offset Estimate from
D
emodulator
Bit
Field Name
Reset
R/W
Description
7:0
FREQOFF_EST
R
T
he estimated frequency offset (2
’s complement) of the carrier.
Resolution is F
XT
AL
/2
14
(1.59
-
1.65 kHz); range is ±202 kHz to
±210 kHz, dependent of XTAL frequency.
Frequency offset compensation is only supported for
2
-
FSK
;
GFSK
and MSK modulation. This register will read 0 when
using OOK modulation.

Texas Instruments CC2500 Specifications

General

Brand	Texas Instruments
Model	CC2500
Category	Transceiver
Language	English