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7Installation
that cannot be anti-reflection coated may reflect up to 25% of the input light
back to your measurement setup. It can be helpful to tilt the sensor a bit or
insert an attenuator in order to reduce the amount of light reflected back into
your measurement setup.
WFS150-7AR / WFS10-7AR uses an anti-reflection (AR) coated MLA that
reduces the reflection from the array to below 1% within the wavelength
range 400 - 900 nm. Note, that the total reflection from the entire instrument
can be higher due to reflection from the CCD cover glass and chip itself.
This model is well suited for applications that do not tolerate back-
reflections back into the measurement setup, for instance because it contains
a laser without an isolator but parallel beam and long coherence length. Use
this model if other ways for preventing back-reflection line tilting the Wavefront
Sensor with respect to the input beam are not feasible.
WFS300-14AR / WFS10-14AR uses an anti-reflection (AR) coated MLA that
reduces the reflection from the array to below 1% within the wavelength
range 400 - 900 nm. Note, that the total reflection from the entire instrument
can be higher due to reflection from the CCD cover glass and chip itself.
Due to the increased focal length this sensor features an increased sensitivity
and accuracy ( /50 instead of /15). On the other side, this advantage comes
along with reduced spatial resolution (300 µm pitch instead of 150 µm) and
dynamic range.
NOTE
The specified reflectivity of the AR coated MLA is valid only within the stated
wavelength range. Outside of this wavelength range, the reflectivity may increase
remarkably. Please see also Microlens Data .
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