OPERATION
Axio Observer Illumination and contrast techniques ZEISS
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5.12.8 Setting up reflected light darkfield
(1) Application
The reflected light darkfield technique is used to examine specimens that do not only have reflective
surfaces of different reflectivity (ideal brightfield objects), but also exhibit scratches, cracks, pores, or in a
nutshell, flat surface deviations. All these light-scattering details shine brightly in the darkfield whilst the
reflective flat surfaces stay dark.
(2) Instrument equipment
− Axio Observer materials with attached microLED or adjusted HAL 100 illuminator
− EC Epiplan-Neofluar or EC Epiplan objectives additionally labeled with "HD".
− ACR P&C dark reflector module.
(3) Setting reflected light darkfield
• Prepare the microscope as described in section 5.12.5 for reflected light brightfield. Fully open the
luminous-field diaphragm.
• Rotate the ACR P&C darkfield reflector module on the reflector turret (Fig. 154/7) into the beam path.
• Select the position with darkfield (HD) objective on the nosepiece (Fig. 154/5).
• Fully open luminous-field diaphragm (Fig. 154/3) and aperture diaphragm (Fig. 154/2); remove any
neutral filter from the beam path.
• If necessary, refocus and view the specimen in the darkfield.
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