11.6.1.2 Completing the test
M13796-25 v5
Continue to test another function or end the test by changing the TESTMODE setting to Disabled.
Restore connections and settings to the original values, if changed for testing purposes.
11.6.2 Two step overvoltage protection OV2PTOV (59)
M13806-2 v6
Prepare the IED for verification of settings as outlined in section
"Requirements" and section "Preparing
for test" in this chapter.
11.6.2.1 Verifying the settings
M13806-9 v2
Verification of single-phase voltage and time delay to trip for Step 1
M13806-50 v10
1. Apply single-phase voltage below the set value Pickup1.
2. Slowly increase the voltage until the PU_ST1 signal appears.
3. Note the trip value and compare it with the set value Pickup1.
The trip value in secondary volts is calculated according to the following equations:
For phase-to-ground measurement:
sec
100
3
Vpickup VBase VT
VTprim
>
´ ´
ANSIEQUATION2426 V1 EN-US (Equation 103)
For phase-to-phase measurement:
sec
100
Vpickup VT
VBase
VTprim
>
´ ´
ANSIEQUATION2427 V1 EN-US (Equation 104)
4. Decrease the voltage slowly and note the reset value.
5. Set and apply about 20% higher voltage than the measured trip value for one phase.
6. Measure the time delay for the TRST1 signal and compare it with the set value.
7. Check the inverse time delay by injecting a voltage corresponding to 1.2 × Vpickup>.
8. Repeat the test to check the inverse time characteristic at different over-voltage levels.
9. Repeat the above described steps for Step 2 of the function.
11.6.2.2 Extended testing
GUID-BE4B4A36-CCEE-4020-B7DC-6A83A43D11F5 v2
1. The tests above can be repeated for 2 out of 3 and for 3 out of 3 operation mode.
Section 11 1MRK 504 165-UUS Rev. J
Testing functionality by secondary injection
206 Transformer protection RET670
Commissioning manual
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