Index-4 Service Guide N5230-90024
Index
configurable test set, Option 014
block diagram, 5-17
description of
, 2-4
operation, 5-16
configuration
high dynamic range
configurable test set
, 5-18
diagram, 5-18
normal
configurable test set
, 5-17
Option 014, 5-17
connector
care
principles of
, 3-5
quick reference
, 3-5
protective end caps
part numbers
, 6-46
repeatability check
failure of
, 3-18
of test port cables
, 3-17
connector repeatability
check
test port cables
, 3-17
connectors
care of, 3-5
front panel, 5-23
USB
, 5-23
rear panel
, 5-10, 5-11, 5-24
1284-C, 5-25
AUX I/O
, 5-11, 5-14
Display
, 5-25
EXT 10 MHz REF IN, 5-10
EXT 10 MHz REF OUT
, 5-10
GPIB
, 5-24
HANDLER I/O, 5-11, 5-13
PARALLEL
, 5-25
RS-232
, 5-24
SERIAL, 5-24
TEST SET I/O
, 5-11, 5-12
TRIG IN
, 5-11
TRIG OUT, 5-11
USB
, 5-24
VGA
, 5-25
constants
correction, 8-20
contacting Agilent
, 2-10
controller board, touch screen
removal and replacement
illustrated
, 7-11
procedure, 7-10
controllers
troubleshooting with, 4-19
correction constants
, 8-20
coupler
port 1
illustrated, 6-17, 6-21, 6-25, 6-29
part number
, 6-16, 6-20, 6-24, 6-28
troubleshooting
, 4-36, 4-37
port 2
illustrated
, 6-17, 6-21, 6-25, 6-29
part number, 6-16, 6-20, 6-24, 6-28
troubleshooting
, 4-36, 4-37
cover, removing
, 1-4
covers, analyzer
illustrated, 6-39
part numbers, 6-38
removal and replacement
illustrated
, 7-7
procedure, 7-6
CPU board
illustrated, 6-13
operation
, 5-24
part numbers
, 6-12
removal and replacement
illustrated
, 7-22
procedure
, 7-20
troubleshooting
, 4-17
cross-over cable, LAN
, 4-21
CSA mark
, 1-8
D
dangerous voltage
, 1-4
data acquisition
operation, 5-24
data acquisition and processing
subgroup, 5-21
data storage
hard disk, 5-25
IDE
, 5-25
data, option
recovering, 8-16
repairing
, 8-16
DCOM
, 8-9
description
functional
digital control group, 5-5
digital processing group
, 5-5
power supply group
, 5-5
receiver group, 5-4
signal separation group
, 5-4
synthesized source group
, 5-4
device connections
system verification, 3-24
digital control group
block diagram, 5-22
functional description of
, 5-5
operation, 5-21
digital processing and control
functional group, 5-3
digital processing group
block diagram, 5-22
functional description of, 5-5
operation
, 5-21
directivity
cause of failure, 8-11
definition of, 8-11
measurements affected by
, 8-11
disabling
options, 8-15
display assembly
illustrated, 6-11
operation
, 5-23
parts list
, 6-10
removal and replacement
illustrated
, 7-11
procedure
, 7-11
troubleshooting, 4-12
display assembly, touch screen
removal and replacement
illustrated
, 7-11, 7-13
procedure
, 7-13
Display port
rear panel connector, 5-25
display test
running, 4-15
documentation
optional, 1-iii
part numbers
, 6-46
standard
, 1-iii
dynamic range, high
configurable test configuration, 5-18
E
earth ground
, 1-3
EE default
adjustment, 3-36
electrostatic discharge,
See ESD
EMI/RFI
supplies
part numbers, 6-47
enabling
options, 8-15
entitlement certificate, option
, 8-14
environment, operating
specifications, 3-4
verification, 3-4
equipment rack
horizontal spacing, 2-4
mounting analyzer in
, 2-4
equipment, service test
required, 2-7
error term data
description of, 8-10
error terms
access to, 8-8
via COM/DCOM commands, 8-9
via front panel
, 8-8
via SCPI commands (using GPIB)
,
8-9
cause of failure to
, 8-3
descriptions
, 8-10
directivity, 8-11
flowgraph of one port
, 8-4
flowgraph of two port
, 8-5, 8-6, 8-7