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Benning ST 760 - Automatic Test Procedures: Class II;III and VDE 0701-0702 Details; Test Procedure Overview for Class II;III; Measured Values for Class II;III Tests (VDE 0701-0702)

Benning ST 760
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73
Test procedure overview Class II/ III
AUTO test no.
Class II
Class III
1
2
3
4
5
6
1
Name
Devices of Class
II
Devices of Class
II with ICont alt.
Devices of Class
II with RInsu 250
V
Devices of Class
II without RInsu
Devices of Class
II without RInsu + ICont
dir.
Devices of Class
II with U
output
Devices of Class
III
Visual inspection
X
X
X
X
X
X
X
Connection test
X
X
X
X
X
X
X
RInsu-1/
RInsu-IN
X
X
X
RInsu-3
X
X
ICont
X
X
Functional test
X
X
X
X
X
Ua
X
X
Measured values of test procedures Class II (VDE 0701-0702)
AUTO
test no.
Name
Individual tests
1
Devices of Class II
RInsu-1 (500 V), functional test with ICont (diff.)
2
Devices of Class II with ICont
alt.
RInsu-1 (500 V), ICont (alt.)
3
Devices of Class II with RInsu
250 V
RInsu-1 (250 V), functional test with ICont (diff.)
4
Devices of Class II without
RInsu
Functional test with ICont (diff.)
5
Devices of Class II without
RInsu + ICont dir.
ICont (dir.), functional test with ICont (diff.)
6
Devices of Class II with U output
RInsu-3 (500 V), functional test with ICont (diff.)
Ua (at secondary output)
Measured values of test procedures Class III (VDE 0701-0702)
AUTO
test no.
Name
Individual tests
1
Devices of Class III
RInsu-3 (500 V), Ua (at secondary output)

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