Hioki IR5050 - Page 86

86
• The table below shows storable data.
Recording
method
Type of data Data stored in one record
Manual
recording
Standard measurement
data
Memory number, date/time, elapsed time,
temperature, humidity, set voltage, actual
output voltage, resistance (nal value),
resistance (1-min. value), PI value, PI or DAR
set time (t
1
), PI or DAR set time (t
2
), resistance
set time (t
1
), and resistance set time (t
2
)
(Even if PI is not selected as the function, PI
is saved as the default setting. If the function
is DAR, the DAR settings are saved instead of
PI.)
SV (step voltage) data
Memory number, date/time, elapsed time,
temperature, humidity, set voltage (maximum
value), actual voltage
×
5, and resistance
×
5
Ramp (ramp voltage test)
data
Memory number, date/time, elapsed time,
temperature, humidity, set voltage (maximum
value), actual voltage, resistance (nal value),
and voltage rise setting
DD (dielectric discharge)
data
Memory number, date/time, elapsed time,
temperature, humidity, set voltage, actual
output voltage, resistance (nal value),
DD value, current 1 min. after end of
measurement, and capacitance
Logging
recording
–
Memory number, date/time, measurement
interval, temperature, humidity, set voltage,
actual output voltage
×
number of times, and
resistance
×
number of times
IMPORTANT
• In step voltage test resistance measurements, only the last measurement at the
end of each step is recorded.
• Voltage measurement data cannot be recorded.
HIOKI IR5050A961-00