NDAC hold-off ................................................................... E-6
Trigger-on-talk ................................................................... E-7
Message available ............................................................... E-7
General operation notes ...................................................... E-7
SRQ when buffer fills with 200 readings ........................... E-8
F Remote Calibration
Introduction ............................................................................... F-2
Calibration commands ............................................................... F-2
Remote calibration overview ..................................................... F-3
G Applications Guide
Measurement considerations ..................................................... G-2
Leakage currents and guarding .......................................... G-2
Input bias current ................................................................ G-3
Voltage burden .................................................................... G-4
Noise and source impedance .............................................. G-5
Electrostatic interference and shielding ............................. G-7
Making connections ......................................................... G-10
Typical range change transients ....................................... G-12
Steps to minimize impact of range change transients ...... G-16
Zero check on / off response ............................................ G-17
Applications ............................................................................. G-18
Diode leakage current ....................................................... G-18
Capacitor leakage current ................................................. G-19
Measuring high resistance ................................................ G-19
Alternating voltage ohms measurement ........................... G-20
Cable insulation resistance ............................................... G-21
Surface insulation resistance (SIR) .................................. G-22
Photodiode characterization prior to dicing ..................... G-23
Focused ion beam applications ........................................ G-25
Using switching systems to measure multiple current sources G-26