G
Applications Guide
• Measurement considerations — Covers measurement considerations for low cur-
rent measurements including Leakage currents and guarding, Input bias current,
Voltage burden, Noise and source impedance, Electrostatic interference and shield-
ing, and Making connections.
• Applications — Covers applications to measure Diode leakage current, Capacitor
leakage current, Measuring high resistance, Cable insulation resistance, Surface
insulation resistance (SIR), Photodiode characterization prior to dicing, Focused
ion beam applications and Using switching systems to measure multiple current
sources.
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