S530 Parametric Test System Test Subroutine Library User's Manual Section 2: Using the test subroutine library
S530-907-01 Rev. A / September 2015 2-3
Bipolar subroutines
Calculate DC at specified I
E
and V
CB
Calculate DC and V
BE
at specified I
C
and
V
CE
Calculate at V
CB
and I
CE
with search on I
E
Calculate at V
CE
and I
CE
with search on I
BE
Calculate when V
BE
swept, at V
CE
and V
SUB
Measure collector-base breakdown voltage,
emitter open
Measure collector-base breakdown voltage
using LPTLib bsweepv subroutine
Measure collector-emitter breakdown voltage,
base open
Measure collector-emitter breakdown voltage
using LPTLib bsweepv subroutine
Measure collector-emitter breakdown voltage
Measure emitter-base breakdown voltage,
collector open
Measure I
CE
, I
BE
and calculate at V
CE
, V
BE
,
V
SUB
Measure collector-base leakage at V
CB
and
V
SUB
Measure collector-emitter leakage at V
CE
and
V
SUB
Measure emitter-collector leakage at V
CES
and V
SUB
Measure emitter-base leakage at V
EB
and
V
SUB
Estimate rcsat when I
C
and I
B
swept at
constant
Estimate emitter resistance
Measure base-emitter voltage at specified I
E
(V
C
= V
B
)